Second Semiconductor Traceability and Provenance Workshop
Date
December 8
Time
8:30 AM ET
Organization
Format
In-Person
Location
Gaithersburg, MD
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About
NIST convenes industry, government, academia, and standards organizations to develop practical approaches to semiconductor traceability and provenance. The workshop addresses what data, artifacts, and evidence can establish traceability and substantiate semiconductor provenance across design, fabrication, assembly and test, packaging, distribution, integration, and deployment. Participants will examine data elements and supply-chain events needed for traceability; artifacts and evidence that substantiate provenance; information that can be shared across organizational boundaries; common identifiers, definitions, relationships, and formats; technical, operational, commercial, and security considerations; and opportunities for interoperability, standards, and scalable implementation. The intended output is an initial set of data elements, evidence types, artifacts, and information-sharing concepts to support subsequent NIST guidance, standards development, and industry implementation. Presentations will be followed by focused working sessions.
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